DocumentCode :
864853
Title :
Josephson modified variable threshold logic gates for use in ultra-high-speed LSI
Author :
Fujimaki, Norio ; Kotani, Seigo ; Imamura, Takeshi ; Hasuo, Shinya
Author_Institution :
Fujitsu Ltd., Atsugi, Japan
Volume :
36
Issue :
2
fYear :
1989
fDate :
2/1/1989 12:00:00 AM
Firstpage :
433
Lastpage :
446
Abstract :
A gate family called modified variable threshold logic (MVTL) is proposed. The OR gate is a two-junction interferometer with one magnetically coupled control line. Magnetic coupling and current injection are used to switch the logic state of the gate. By optimizing the gate parameters, an operating margin of ±43% and a switching speed of 2.5 ps/gate are obtained. the gate area is 30 μm×24 μm with a 1.5-μm minimum junction diameter. The gate family consists of an OR gate, a single-junction AND gate, and a timed inverter (TI) that consists of the OR gate, a junction, and resistors. The delay time of the gate operated in the actual circuit was found to be less than 10 ps. Circuits having up to 1000 gates, the critical path model of a 16-bit×16-bit multiplier, and a 16-bit arithmetic logic unit have been successfully operated. When the Josephson gate is operated with three-phase power, it is possible to construct any sequential circuit without the complex latch circuit required to prevent the race condition for one- or two-phase power supplies
Keywords :
integrated logic circuits; large scale integration; logic gates; superconducting logic circuits; 1.5 micron; 10 ps; 16 bit; 2.5 ps; Josephson gate; MVTL; OR gate; arithmetic logic unit; critical path model; current injection; delay time; gate area; gate family; junction diameter; modified variable threshold logic; multiplier; one magnetically coupled control line; operating margin; sequential circuit; single-junction AND gate; switching speed; three-phase power; timed inverter; two-junction interferometer; ultra-high-speed LSI; Circuits; Couplings; Delay effects; Inverters; Josephson junctions; Logic gates; Magnetic switching; Magnetic variables control; Resistors; Switches;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.19947
Filename :
19947
Link To Document :
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