• DocumentCode
    865199
  • Title

    Demonstration and analysis of a 40-gigasample/s interferometric analog-to-digital converter

  • Author

    Stigwall, Johan ; Galt, Sheila

  • Author_Institution
    Photonics Lab., Chalmers Univ. of Technol., Goteborg
  • Volume
    24
  • Issue
    3
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    1247
  • Lastpage
    1256
  • Abstract
    A novel interferometric scheme for photonic analog-to-digital conversion is for the first time experimentally demonstrated at a real-time sample rate of 40 gigasamples/s. The scheme includes sampling as well as binary encoding, and the input signal in the experiment was a 1.25-GHz sinusoidal tone that was successfully digitized with a nominal resolution of 21 digital levels. Single-sample measurements yielded an effective number of bits (ENOB) of 2.6, which was limited by thermal detection noise while multisample averaged measurements resulted in an ENOB of 3.6 bits, mainly limited by phase drift. Apart from the experimental results, this paper covers an extensive theoretical analysis of the system, including calculations on the fundamental maximum bandwidth, the required optical power, the generated binary code, and its error robustness, as well as the impact of detection noise on the signal-to-noise ratio of the digitized signal. The major benefits of this interferometric scheme are that only one standard phase modulator is required and that the phase swing does not have to be larger than plusmnpi to reach the full digital value space
  • Keywords
    analogue-digital conversion; binary codes; error analysis; light interferometry; optical information processing; optical modulation; phase modulation; 1.25 GHz; analog-to-digital converter; binary code; binary encoding; digitized signal; interferometric converter; multisample averaged measurements; phase drift; photonic analog-to-digital conversion; real-time sampling; signal-to-noise ratio; single-sample measurements; standard phase modulator; thermal detection noise; Analog-digital conversion; Encoding; Noise measurement; Optical interferometry; Optical noise; Phase detection; Phase measurement; Sampling methods; Signal resolution; Signal to noise ratio; Analog–digital conversion; electrooptical modulation; optical interferometry; phase modulation; photonic analog-to-digital converter (ADC); photonic sampling;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2005.863262
  • Filename
    1605326