• DocumentCode
    865243
  • Title

    90-nm CMOS for microwave power applications

  • Author

    Ferndahl, M. ; Vickes, H.-O. ; Zirath, Herbert ; Angelov, I. ; Ingvarson, F. ; Litwin, A.

  • Author_Institution
    Microwave Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    13
  • Issue
    12
  • fYear
    2003
  • Firstpage
    523
  • Lastpage
    525
  • Abstract
    We report, for the first time, the experimental evaluation of a very short channel 90-nm CMOS transistor under RF over-voltage conditions. At 9 GHz and 1.5 V supply a 40 μm gate width device is able to deliver 370 mW/mm output power with a PAE of 42% and a transducer power gain of 15 dB. Measurement results at 3 and 6 GHz is also presented. The transistor does not show any degradation in either dc or RF performance after prolonged operation at 1 and 6 dB compression. Simulation show, that the peak voltage, V/sub ds/ at this condition is 3.0 V, while the maximum allowed dc supply voltage is limited by the design rules to 1.2 V. We show for the first time that nanometer-scale CMOS can be used for microwave power applications with severe RF over-voltage conditions without any observable degradation.
  • Keywords
    S-parameters; microwave power amplifiers; microwave power transistors; nanoelectronics; power MOSFET; 1.5 V; 9 GHz; 90 nm; RF overvoltage conditions; microwave power amplifier; microwave power handling capabilities; nanometer-scale CMOS; peak voltage; small signal S-parameter; supply voltage; very short channel CMOS transistor; Bluetooth; CMOS technology; Costs; Degradation; Microwave technology; Microwave transistors; Power generation; Radio frequency; Voltage; Wireless LAN;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2003.819380
  • Filename
    1261771