DocumentCode
865243
Title
90-nm CMOS for microwave power applications
Author
Ferndahl, M. ; Vickes, H.-O. ; Zirath, Herbert ; Angelov, I. ; Ingvarson, F. ; Litwin, A.
Author_Institution
Microwave Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
Volume
13
Issue
12
fYear
2003
Firstpage
523
Lastpage
525
Abstract
We report, for the first time, the experimental evaluation of a very short channel 90-nm CMOS transistor under RF over-voltage conditions. At 9 GHz and 1.5 V supply a 40 μm gate width device is able to deliver 370 mW/mm output power with a PAE of 42% and a transducer power gain of 15 dB. Measurement results at 3 and 6 GHz is also presented. The transistor does not show any degradation in either dc or RF performance after prolonged operation at 1 and 6 dB compression. Simulation show, that the peak voltage, V/sub ds/ at this condition is 3.0 V, while the maximum allowed dc supply voltage is limited by the design rules to 1.2 V. We show for the first time that nanometer-scale CMOS can be used for microwave power applications with severe RF over-voltage conditions without any observable degradation.
Keywords
S-parameters; microwave power amplifiers; microwave power transistors; nanoelectronics; power MOSFET; 1.5 V; 9 GHz; 90 nm; RF overvoltage conditions; microwave power amplifier; microwave power handling capabilities; nanometer-scale CMOS; peak voltage; small signal S-parameter; supply voltage; very short channel CMOS transistor; Bluetooth; CMOS technology; Costs; Degradation; Microwave technology; Microwave transistors; Power generation; Radio frequency; Voltage; Wireless LAN;
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/LMWC.2003.819380
Filename
1261771
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