• DocumentCode
    865408
  • Title

    In Situ Studies of the Effects of Ion Beams on Materials Using the Electron Microscope Ion Beam Interface

  • Author

    Ishino, S. ; Kawanishi, H. ; Fukuya, K. ; Muroga, T.

  • Author_Institution
    Department of Nuclear Engineering, University of Tokyo, Hongo, Bunkyo-ku, Tokyo, Japan 113
  • Volume
    30
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    1255
  • Lastpage
    1258
  • Abstract
    To investigate microstructural evolution by cascade damage produced by energetic heavy particles, we have built a facility which is capable of observing damaged structure introduced by heavy ions in situ in an electron microscope. A 400 kV Cockcroft-Walton type heavy ion accelerator with a Danfysik 911A heavy-ion source has been combined with a 200 kV electron microscope. Heavy ion beams of energies up to 400 keV can bombard the specimen in the microscope with an incident angle of 45 degrees to the electron beam axis. This paper describes the outline of the facility and some of the recent results mainly concerned with heavy radiation damage of materials which are relevant to fast breeder and fusion reactor development. For example, we have investigated microstructural evolution of SUS 316 stainless steel as a function of dose, dose rate and temperature. The topics will also include observation of short-lived clusters of point defects during irradiation in nickel and direct comparison of self-ion damage in aluminum with electron damage caused by an electron beam within the 200 kV microscope. Some of these results have been discussed, compared with cascade simulation and defect kinetics calculations. The experimental results may be useful to establish correlation between neutron and ion damage through microstructural evolution modelling.
  • Keywords
    Aluminum; Electron beams; Electron microscopy; Fusion reactors; Ion accelerators; Ion beams; Kinetic theory; Nickel; Steel; Temperature;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4332503
  • Filename
    4332503