Title :
Equivelent gain of single-valued nonlinearities with multiple inputs
Author_Institution :
McMaster University, Hamilton, Ontario, Canada
fDate :
10/1/1963 12:00:00 AM
Keywords :
Nonlinearities; Admittance; Frequency; Gain measurement; Gaussian noise; Linearity; Noise measurement; Oscilloscopes; Particle measurements; Probability distribution; Terminology;
Journal_Title :
Automatic Control, IEEE Transactions on
DOI :
10.1109/TAC.1963.1105595
