• DocumentCode
    865663
  • Title

    Trace Element Measurements with Synchrotron Radiation

  • Author

    Hanson, A.L. ; Kraner, H.W. ; Jones, K.W. ; Gordon, B.M. ; Mills, R.E. ; Chen, J.R.

  • Author_Institution
    Brookhaven National Laboratory Upton, New York 11973 U.S.A.
  • Volume
    30
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    1339
  • Lastpage
    1342
  • Abstract
    Aspects of the application of synchrotron radiation to trace element determinations by x-ray fluorescence have been investigated using beams from the Cornell facility, CHESS. Fluoresced x rays were deteted with a Si(Li) detector placed 4 cm from the target at 90° to the beam. Thick samples of NBS Standard Reference Materials were used to calibrate trace element sensitivity and estimate minimum detectable limits for this method.
  • Keywords
    Brightness; Chemical elements; Electromagnetic wave absorption; Electrons; Fluorescence; Polarization; Spatial resolution; Synchrotron radiation; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4332526
  • Filename
    4332526
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=865663