Title :
MIG mini composite head using single crystal Mn-Zn ferrite
Author :
Iwata, H. ; Noguchi, K. ; Suwabe, S. ; Nishiyama, T.
Author_Institution :
Hitachi Metals Ltd., Saitama, Japan
fDate :
9/1/1990 12:00:00 AM
Abstract :
Metal-in-gap (MIG) miniature composite heads whose magnetic circuit is composed of single-crystal Mn-Zn ferrite and sputtered Fe-Al-Si film were prepared. Recording and readback characteristics are compared with those of MIG heads using polycrystalline Mn-Zn ferrite. The relationship between timing asymmetry and bit shift is discussed. Results of magnetic-domain observation by SPIN SEM (scanning electron microscopy) are presented. The output voltage of the single-crystal ferrite MIG head showed a 35% higher value than that of ordinary polycrystalline ferrite. This result is due to the higher readback efficiency, arising from higher permeability of the stressed ferrite. Bit shifts of single-crystal MIG heads are small because of their small timing asymmetry and sharp distribution. Timing asymmetry fluctuations are thought to be due to Barkhausen-like domain-wall pinning through readback. This phenomenon is much less significant in single-crystal ferrites; hence, MIG heads are more suitable for high-density recording than polycrystalline ferrite heads
Keywords :
Barkhausen effect; composite materials; ferrites; magnetic domain walls; magnetic domains; magnetic heads; magnetic recording; manganese compounds; scanning electron microscope examination of materials; zinc compounds; Barkhausen-like domain-wall pinning; FeAlSi; MIG mini composite head; MnZnFeO; SPIN SEM; asymmetry fluctuations; bit shift; high-density recording; magnetic-domain observation; metal in gap miniature heads; output voltage; permeability; readback characteristics; recording characteristics; scanning electron microscopy; sharp distribution; single crystal Mn-Zn ferrite; sputtered Fe-Al-Si film; stressed ferrite; timing asymmetry; Ferrite films; Magnetic circuits; Magnetic films; Magnetic force microscopy; Magnetic heads; Magnetic recording; Permeability; Scanning electron microscopy; Timing; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on