Title :
Breakdown phenomena in double–gate field–effect transistors
Author :
Cobbold, Richard S. C. ; Trofimenkoff, F.N.
Keywords :
Antenna measurements; Atmospheric measurements; Electric breakdown; Frequency measurement; Millimeter wave measurements; Sun; Temperature measurement; Thermal resistance; Time measurement; Wavelength measurement;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1964.3400
