DocumentCode :
866012
Title :
Compensation of Aberrations in Achromatic Quadrupole Doublets
Author :
Martin, F.W. ; Goloskie, R.
Author_Institution :
Microscope Associates, Inc., 50 Village Ave., Dedham, Mass. 02026
Volume :
30
Issue :
2
fYear :
1983
fDate :
4/1/1983 12:00:00 AM
Firstpage :
1472
Lastpage :
1475
Abstract :
An achromatic quadrupole lens contains an electric and a magnetic quadrupole lens operated at the proper field ratio. Using a doublet of achromatic lenses in which a quadrupole voltage may be applied to the magnetic poles of one of the lenses in order to rotate its principal section, we have eliminated simultaneously what may be called three first order aberrations of a quadrupole doublet. These are chromatic aberration, rotational misorientation, and focus. By adding suitably chosen small potentials to the quadrupole excitation of an electric lens, 2nd order parasitic aberration may be compensated. Experimental procedure for compensation is described. The procedure appears capable of improvement, and further work is warranted. Currently a beam of 600 keV protons with a width of 0.6 micron is obtained.
Keywords :
Electron beams; Electron microscopy; Ion beams; Lenses; Magnetic force microscopy; Particle beams; Physics; Protons; Structural beams; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1983.4332563
Filename :
4332563
Link To Document :
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