• DocumentCode
    866032
  • Title

    Overwrite characteristics of thin film head and media systems

  • Author

    Akoh, S. ; Takagishi, M. ; Hiroshima, T.

  • Author_Institution
    Sumitomo Metal Ind. Ltd., Amagasaki, Japan
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    2454
  • Lastpage
    2456
  • Abstract
    The authors measured the saturation properties of overwrite on three thin-film heads with pole lengths of P=2.6 μm, 3.6 μm, and 4.4 μm in combination with three thin-film media with coercivities of Hc=1200 Oe, 1300 Oe, and 1550 Oe. The 4.4-μm head shows an interesting saturation profile in which overwrite first reaches the minimum MMF (magnetomotive force) value of around 0.45 AT and then increases for larger MMF. Regarding this resonance-like phenomenon, the overwrite properties were shown to be strongly dependent upon leading pole length and overwritten (LF) bit length, as well as on the overwriting frequency (HF). It is concluded that when designing heads, the optimum pole length should be selected to satisfy both the overwrite and readback characteristics at any track of the drive
  • Keywords
    coercive force; magnetic heads; magnetic thin film devices; coercivities; magnetomotive force; overwrite properties; pole lengths; readback characteristics; saturation properties; thin-film heads; thin-film media; Coercive force; Force measurement; Frequency; Hafnium; Length measurement; Magnetic heads; Magnetic properties; Magnetic resonance; Saturation magnetization; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104762
  • Filename
    104762