DocumentCode :
866032
Title :
Overwrite characteristics of thin film head and media systems
Author :
Akoh, S. ; Takagishi, M. ; Hiroshima, T.
Author_Institution :
Sumitomo Metal Ind. Ltd., Amagasaki, Japan
Volume :
26
Issue :
5
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
2454
Lastpage :
2456
Abstract :
The authors measured the saturation properties of overwrite on three thin-film heads with pole lengths of P=2.6 μm, 3.6 μm, and 4.4 μm in combination with three thin-film media with coercivities of Hc=1200 Oe, 1300 Oe, and 1550 Oe. The 4.4-μm head shows an interesting saturation profile in which overwrite first reaches the minimum MMF (magnetomotive force) value of around 0.45 AT and then increases for larger MMF. Regarding this resonance-like phenomenon, the overwrite properties were shown to be strongly dependent upon leading pole length and overwritten (LF) bit length, as well as on the overwriting frequency (HF). It is concluded that when designing heads, the optimum pole length should be selected to satisfy both the overwrite and readback characteristics at any track of the drive
Keywords :
coercive force; magnetic heads; magnetic thin film devices; coercivities; magnetomotive force; overwrite properties; pole lengths; readback characteristics; saturation properties; thin-film heads; thin-film media; Coercive force; Force measurement; Frequency; Hafnium; Length measurement; Magnetic heads; Magnetic properties; Magnetic resonance; Saturation magnetization; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.104762
Filename :
104762
Link To Document :
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