DocumentCode
866053
Title
Seamless test of digital components in mixed-signal paths
Author
Ozev, Sule ; Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Volume
21
Issue
1
fYear
2004
Firstpage
44
Lastpage
55
Abstract
For today´s large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. We offer an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.
Keywords
integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; analog modules; analog signals; digital components; digital modules; digital test methodology; mixed-signal designs; system-on-chip; test generation; test inputs; Circuit faults; Circuit testing; Codecs; Digital circuits; Fault detection; Frequency domain analysis; Shape control; Signal design; Signal processing; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2004.1261849
Filename
1261849
Link To Document