Title :
Seamless test of digital components in mixed-signal paths
Author :
Ozev, Sule ; Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Abstract :
For today´s large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. We offer an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; analog modules; analog signals; digital components; digital modules; digital test methodology; mixed-signal designs; system-on-chip; test generation; test inputs; Circuit faults; Circuit testing; Codecs; Digital circuits; Fault detection; Frequency domain analysis; Shape control; Signal design; Signal processing; System testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2004.1261849
