DocumentCode
866125
Title
Time and Frequency Standards Based on Charged Particle Trapping
Author
Itano, Wayne M. ; Wineland, D.J. ; Hemmati, H. ; Bergquist, J.C. ; Bollinger, J.J.
Author_Institution
Time and Frequency Division National Bureau of Standards Boulder, Colorado 80303
Volume
30
Issue
2
fYear
1983
fDate
4/1/1983 12:00:00 AM
Firstpage
1521
Lastpage
1523
Abstract
Microwave or optical frequency standards based on internal resonance transitions of ions confined in electromagnetic traps have the fundamental advantages of long observation times and small perturbations. These advantages are somewhat offset by low signal to noise ratios. Work at NBS has concentrated on microwave hyperfine transitions of atomic ions stored in Penning-type ion traps. The use of narrowband, tunable light sources for state selection and detection and for reducing the average kinetic energy of the ions (laser cooling) is an important feature of this work. Results to date include the fluorescence detection and cooling to about 50 mK of a single Mg+ ion and the observation of a 0.012 Hz linewidth on a 300 MHz 25Mg+ hyperfine transition. A frequency standard based on 201Hg+ ions is under development. Related work, mostly based on RF-type ion traps, is underway at several other labs.
Keywords
Atom optics; Atomic beams; Charge carrier processes; Cooling; Frequency; NIST; Optical noise; Particle beam optics; Resonance; Signal to noise ratio;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4332575
Filename
4332575
Link To Document