DocumentCode :
866150
Title :
Review of analytical models for the study of highly doped regions of silicon devices
Author :
Cuevas, Andrés ; Balbuena, Miguel A.
Author_Institution :
Dept. of Electron. Phys., Polytech. Univ. of Madrid, Spain
Volume :
36
Issue :
3
fYear :
1989
fDate :
3/1/1989 12:00:00 AM
Firstpage :
553
Lastpage :
560
Abstract :
Several analytical models developed to study the transport of minority carriers in heavily doped emitter regions of silicon devices are reviewed and compared. To calculate the emitter recombination current, special emphasis is placed on the models of J. Del Alamo and R.M. Swanson (ibid, vol.31, no.12, p.1878-88, 1984) and of J.S. Park, A. Neugroschel, and F. Lindholm (ibid, vol.33, no.2, p.240-8, 1986), which are shown to contain other previous models. For solar cells and photodiodes, the quantum collection efficiency and the photogenerated current are also to be calculated; the models developed by M.A. Green and A.W. Blakers (ibid, vol.30, no.10, p.1360-5, 1983) and by J. Del Alamo and Swanson (Proc. 17th IEEE Photovoltai Specialists Conf., p.1303-8, 1984) for that purpose is described and extended. The approximate analytical solutions are shown to constitute upper and lower bounds on the exact solution. The accuracy and range of applicability of these bounds are discussed
Keywords :
bipolar transistors; elemental semiconductors; photodiodes; semiconductor device models; semiconductor doping; silicon; solar cells; Si devices; analytical models; approximate analytical solutions; emitter recombination current; heavily doped emitter regions; highly doped regions; lower bounds; photodiodes; photogenerated current; quantum collection efficiency; range of applicability; solar cells; transport of minority carriers; upper bounds; Analytical models; Equations; Helium; Light sources; Photodiodes; Photovoltaic cells; Radiative recombination; Silicon devices; Solar power generation; Telecommunication standards;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.19968
Filename :
19968
Link To Document :
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