Title :
Applications of a laser-induced plasma pathway to testing of electronic modules
Author :
Umstadter, Karl R. ; Millard, Don L. ; Block, Robert C.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
The authors discuss further developments and experimental applications of an in situ noncontact testing (NCT) system for printed-wire boards (PWBs). The results demonstrate the system´s ability to overdrive logic circuits using the signal injection, making it an excellent means for analyzing operating hardware without disruption. The results also indicate that the NCT probe can serve well as a low-cost front end for test systems already in service.<>
Keywords :
laser beam applications; modules; printed circuit testing; electronic modules testing; laser-induced plasma pathway; logic circuits; low-cost front end; noncontact testing; operating hardware; printed-wire boards; signal injection; test systems; Distortion measurement; Electric variables measurement; Electrical resistance measurement; Electrodes; Electronic equipment testing; Laser applications; Plasma applications; Plasma measurements; Probes; System testing;
Journal_Title :
Design & Test of Computers, IEEE
