Title :
A tutorial on built-in self-test. I. Principles
Author :
Agrawal, Vishwani D. ; Kime, Charles R. ; Saluja, Kwal K.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed
Keywords :
built-in self test; built-in self-test; economics; hierarchical test structures; linear feedback shift register theory; overview; pattern generation; response analysis; Automatic testing; Availability; Built-in self-test; Costs; Digital systems; Hardware; Life testing; Performance evaluation; System testing; Tutorial;
Journal_Title :
Design & Test of Computers, IEEE
