• DocumentCode
    866432
  • Title

    A tutorial on built-in self-test. I. Principles

  • Author

    Agrawal, Vishwani D. ; Kime, Charles R. ; Saluja, Kwal K.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • Volume
    10
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    73
  • Lastpage
    82
  • Abstract
    An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed
  • Keywords
    built-in self test; built-in self-test; economics; hierarchical test structures; linear feedback shift register theory; overview; pattern generation; response analysis; Automatic testing; Availability; Built-in self-test; Costs; Digital systems; Hardware; Life testing; Performance evaluation; System testing; Tutorial;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.199807
  • Filename
    199807
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=866432