Title :
1.3 V 20 ps time-to-digital converter for frequency synthesis in 90-nm CMOS
Author :
Staszewski, Robert Bogdan ; Vemulapalli, Sudheer ; Vallur, Prasant ; Wallberg, John ; Balsara, Poras T.
Author_Institution :
Wireless Analog Technol. Center, Texas Instrum. Inc., Dallas, TX, USA
fDate :
3/1/2006 12:00:00 AM
Abstract :
We propose and demonstrate a 20-ps time-to-digital converter (TDC) realized in 90-nm digital CMOS. It is used as a phase/frequency detector and charge pump replacement in an all-digital phase-locked loop for a fully-compliant Global System for Mobile Communications (GSM) transceiver. The TDC core is based on a pseudodifferential digital architecture that makes it insensitive to nMOS and pMOS transistor mismatches. The time conversion resolution is equal to an inverter propagation delay, which is the finest logic-level regenerative timing in CMOS. The TDC is self calibrating with the estimation accuracy better than 1%. It additionally serves as a CMOS process strength estimator for analog circuits in this large system-on-chip. Measured integral nonlinearity is 0.7 least significant bits. The TDC consumes 5.3 mA raw and 1.3 mA with power management from a 1.3-V supply.
Keywords :
CMOS digital integrated circuits; calibration; frequency synthesizers; phase detectors; phase locked loops; transceivers; 1.3 V; 1.3 mA; 20 ps; 5.3 mA; 90 nm; CMOS process strength estimator; GSM transceiver; Global System for Mobile Communications; all-digital phase-locked loop; analog circuits; charge pump replacement; deep-sub-micrometer CMOS; digital architecture; frequency synthesis; phase/frequency detector; system-on-chip; time-to-digital converter; Charge pumps; Frequency conversion; Frequency synthesizers; GSM; MOS devices; MOSFETs; Phase detection; Phase frequency detector; Phase locked loops; Transceivers; All digital; calibration; compensation; deep-submicrometer CMOS; frequency synthesizer; time-to-digital converter (TDC);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2005.858754