Title :
Spatial Resolution in Industrial Tomography
Author :
Chiang, Be-Shan ; Gautam, S.R. ; Hopkins, F.F. ; Morgan, I.L.
Author_Institution :
Scientific Measurement Systems, Inc., Austin, Texas
fDate :
4/1/1983 12:00:00 AM
Abstract :
The parametric dependence of spatial resolution on tomographic parameters is investigated. The influence of Computerized Tomographic parameters, such as the number of angular views, ray spacings in a fan beam, the degree of collimation, and the magnitude of the object opacity, on the spatial resolution is studied. The research was carried out using a specially designed resolution phantom. The phantom was designed to incorporate features of varying sizes, shapes and mass densities. An index of resolution is defined to quantatively express the results of this study.
Keywords :
Attenuation; Collimators; Computed tomography; Electrons; Imaging phantoms; Nondestructive testing; Radiography; Shape; Single photon emission computed tomography; Spatial resolution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332612