Title :
Improving defect detection in static-voltage testing
Author :
Renovell, Michel ; Azaïs, Florence ; Bertrand, Yves
Author_Institution :
Microelectron. Dept., Lab. d´´Informatique Robotique Microelectronique de Montpellier, France
Abstract :
Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.
Keywords :
automatic testing; electronic equipment testing; logic testing; production testing; circuit outputs; defect behavior; defect detection; detection domains; manufactured unit; manufacturing technology; random parameters; static-voltage testing; test escape; test process; test vectors; Boolean functions; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Propagation delay; Terminology; Threshold voltage;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1047747
