DocumentCode
866535
Title
Measurements of the wear of a thin film disk
Author
Phipps, P.B.P.
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
Volume
26
Issue
5
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
2496
Lastpage
2498
Abstract
A test designed to simulate worst-case start-stop contacts is described. It combines controlled contact stresses with well-defined flying. Magnetic readback and optical methods are used to characterize the damage. Two failure modes are observed: in one, the disk is overstressed and it fails rapidly; the other mode of failure occurs for lower stresses. Contacts induce changes which increase with repeated contacts until failure occurs. Changes in the magnetic signal and in the reflected light intensity and ellipticity are reported. The optical phenomena are attributed to the overcoat being worn thin. The average depth of the trough is found to be similar to the loss of overcoat thickness. Failure is similar to that observed with higher stresses. It is characterized by an increase in light scattering, by a nonlinear and irregular increase in wear with increasing number of contacts, and by spreading of the damage to other areas. These phenomena are shown to be delamination and three-body wear. The magnetic measurements prove to be a sensitive detector of mechanical head/disk interaction, showing changes before overcoat thinning could be detected
Keywords
failure analysis; light scattering; magnetic disc storage; magnetic recording; wear testing; controlled contact stresses; delamination; ellipticity; failure modes; flying; light scattering; magnetic readback; magnetic signal; mechanical head/disk interaction; optical methods; optical phenomena; overcoat thinning; reflected light intensity; repeated contacts; thin film disk; three-body wear; trough; worst-case start-stop contacts; Light scattering; Magnetosphere; Nonlinear optics; Optical films; Optical losses; Optical scattering; Optical sensors; Stress control; Testing; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.104775
Filename
104775
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