DocumentCode :
866535
Title :
Measurements of the wear of a thin film disk
Author :
Phipps, P.B.P.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
26
Issue :
5
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
2496
Lastpage :
2498
Abstract :
A test designed to simulate worst-case start-stop contacts is described. It combines controlled contact stresses with well-defined flying. Magnetic readback and optical methods are used to characterize the damage. Two failure modes are observed: in one, the disk is overstressed and it fails rapidly; the other mode of failure occurs for lower stresses. Contacts induce changes which increase with repeated contacts until failure occurs. Changes in the magnetic signal and in the reflected light intensity and ellipticity are reported. The optical phenomena are attributed to the overcoat being worn thin. The average depth of the trough is found to be similar to the loss of overcoat thickness. Failure is similar to that observed with higher stresses. It is characterized by an increase in light scattering, by a nonlinear and irregular increase in wear with increasing number of contacts, and by spreading of the damage to other areas. These phenomena are shown to be delamination and three-body wear. The magnetic measurements prove to be a sensitive detector of mechanical head/disk interaction, showing changes before overcoat thinning could be detected
Keywords :
failure analysis; light scattering; magnetic disc storage; magnetic recording; wear testing; controlled contact stresses; delamination; ellipticity; failure modes; flying; light scattering; magnetic readback; magnetic signal; mechanical head/disk interaction; optical methods; optical phenomena; overcoat thinning; reflected light intensity; repeated contacts; thin film disk; three-body wear; trough; worst-case start-stop contacts; Light scattering; Magnetosphere; Nonlinear optics; Optical films; Optical losses; Optical scattering; Optical sensors; Stress control; Testing; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.104775
Filename :
104775
Link To Document :
بازگشت