DocumentCode
866595
Title
A study of purple plague and its role in integrated circuits
Author
Selikson, B. ; Longo, T.A.
Author_Institution
Sylvania Electric Products Inc., Woburn, Mass.
Volume
52
Issue
12
fYear
1964
Firstpage
1638
Lastpage
1641
Abstract
Purple plague is shown to be the development of a purple intermetallic compound AuAl2 when gold wires are bonded to aluminum metallization regions in silicon transistors and integrated circuits. It is further shown that the rate of formation of purple plague is catalyzed by the presence and interaction of silicon, and that the catalyzed product is harmful to the device. Part of the ternary system is investigated to elucidate the mechanism of the ternary interaction. Various metallization-wire systems are reviewed which are currently in use or development. The use of aluminum wire to aluminum metallization is shown to be the simplest, most reliable method presently available for eliminating purple plague.
Keywords
Aluminum; Bonding; Gold; Inorganic materials; Integrated circuit metallization; Integrated circuit reliability; Intermetallic; Ohmic contacts; Silicon; Wire;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1964.3459
Filename
1445389
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