• DocumentCode
    866595
  • Title

    A study of purple plague and its role in integrated circuits

  • Author

    Selikson, B. ; Longo, T.A.

  • Author_Institution
    Sylvania Electric Products Inc., Woburn, Mass.
  • Volume
    52
  • Issue
    12
  • fYear
    1964
  • Firstpage
    1638
  • Lastpage
    1641
  • Abstract
    Purple plague is shown to be the development of a purple intermetallic compound AuAl2when gold wires are bonded to aluminum metallization regions in silicon transistors and integrated circuits. It is further shown that the rate of formation of purple plague is catalyzed by the presence and interaction of silicon, and that the catalyzed product is harmful to the device. Part of the ternary system is investigated to elucidate the mechanism of the ternary interaction. Various metallization-wire systems are reviewed which are currently in use or development. The use of aluminum wire to aluminum metallization is shown to be the simplest, most reliable method presently available for eliminating purple plague.
  • Keywords
    Aluminum; Bonding; Gold; Inorganic materials; Integrated circuit metallization; Integrated circuit reliability; Intermetallic; Ohmic contacts; Silicon; Wire;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.3459
  • Filename
    1445389