DocumentCode :
866595
Title :
A study of purple plague and its role in integrated circuits
Author :
Selikson, B. ; Longo, T.A.
Author_Institution :
Sylvania Electric Products Inc., Woburn, Mass.
Volume :
52
Issue :
12
fYear :
1964
Firstpage :
1638
Lastpage :
1641
Abstract :
Purple plague is shown to be the development of a purple intermetallic compound AuAl2when gold wires are bonded to aluminum metallization regions in silicon transistors and integrated circuits. It is further shown that the rate of formation of purple plague is catalyzed by the presence and interaction of silicon, and that the catalyzed product is harmful to the device. Part of the ternary system is investigated to elucidate the mechanism of the ternary interaction. Various metallization-wire systems are reviewed which are currently in use or development. The use of aluminum wire to aluminum metallization is shown to be the simplest, most reliable method presently available for eliminating purple plague.
Keywords :
Aluminum; Bonding; Gold; Inorganic materials; Integrated circuit metallization; Integrated circuit reliability; Intermetallic; Ohmic contacts; Silicon; Wire;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.3459
Filename :
1445389
Link To Document :
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