• DocumentCode
    866619
  • Title

    Programmed interconnections—A release from tyranny

  • Author

    Mackintosh, I.M. ; Green, D.

  • Author_Institution
    Elliott-Automation Ltd., Borehamwood, Herts., England
  • Volume
    52
  • Issue
    12
  • fYear
    1964
  • Firstpage
    1648
  • Lastpage
    1651
  • Abstract
    The problem of complex interconnection patterns on multicomponent single-chip integrated circuits is discussed. It is argued that the full economic and size advantages of digital integrated circuits will only be realized if techniques can be developed for fabricating single-chip circuits consisting of several thousands of individual devices. The improbability of achieving perfect yields over such large and complex areas, the random distribution of faulty devices, and the economic difficulty of making custom interconnection masks to avoid these faults, make this objective unattainable by conventional techniques. A possible solution to this problem is described in the terms of a programmable beam of electrons, and the results of a simple experiment are presented which suggest that the proposed technique is intrinsically feasible.
  • Keywords
    Circuit faults; Costs; Electron beams; Environmental economics; Integrated circuit interconnections; Logic functions; Logic gates; Redundancy; Silicon; Space technology;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.3461
  • Filename
    1445391