DocumentCode :
866619
Title :
Programmed interconnections—A release from tyranny
Author :
Mackintosh, I.M. ; Green, D.
Author_Institution :
Elliott-Automation Ltd., Borehamwood, Herts., England
Volume :
52
Issue :
12
fYear :
1964
Firstpage :
1648
Lastpage :
1651
Abstract :
The problem of complex interconnection patterns on multicomponent single-chip integrated circuits is discussed. It is argued that the full economic and size advantages of digital integrated circuits will only be realized if techniques can be developed for fabricating single-chip circuits consisting of several thousands of individual devices. The improbability of achieving perfect yields over such large and complex areas, the random distribution of faulty devices, and the economic difficulty of making custom interconnection masks to avoid these faults, make this objective unattainable by conventional techniques. A possible solution to this problem is described in the terms of a programmable beam of electrons, and the results of a simple experiment are presented which suggest that the proposed technique is intrinsically feasible.
Keywords :
Circuit faults; Costs; Electron beams; Environmental economics; Integrated circuit interconnections; Logic functions; Logic gates; Redundancy; Silicon; Space technology;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.3461
Filename :
1445391
Link To Document :
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