Surface contamination on sputter carbon coated disks measured by using low energy photoelectron spectroscopy in an ambient atmosphere

Author

Nishimori, K. ; Tanaka, K. ; Sato, K.

Author_Institution

Dept. of Mech. Eng., Nagaoka Univ. of Technol., Niigata, Japan

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

2508

Lastpage

2510

Abstract

The influence of surface contamination on sputtered carbon films on a rigid thin-film disk was evaluated with LEPS (low-energy photoelectron spectroscopy) and XPS (X-ray photoelectron spectroscopy). LEPS was as sensitive as XPS for detecting the surface contaminant. LEPS had the advantage of operating in an ambient atmosphere, while XPS was useful for the identification of the chemical species of the contaminant. The XPS analysis revealed that the main contaminant was due to water in air. XPS showed that the wettability of the fluorocarbon lubricant decreased with an increase in the exposure time of the sputtered carbon film to air before lubrication or with a surface-contaminant increase on the sputtered carbon film

Keywords

X-ray photoelectron spectra; carbon; magnetic disc storage; magnetic recording; photoelectron spectra; sputtered coatings; C; LEPS; X-ray photoelectron spectroscopy; XPS; ambient atmosphere; chemical species; exposure time; fluorocarbon lubricant; low energy photoelectron spectroscopy; rigid thin-film disk; sputter coated disks; surface contamination; water; wettability; Atmosphere; Energy measurement; Lubricants; Magnetic films; Pollution measurement; Rough surfaces; Spectroscopy; Sputtering; Surface contamination; Surface roughness;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104779

Filename

104779