Title :
Microwave measurement of resistivity
Author_Institution :
Centre National d´Etudes des Télécommunications, Issy-les-Moulineaux, France
fDate :
8/1/1965 12:00:00 AM
Abstract :
A mathematical description is given of the possible use of pulse modulation of millimetre e.m. waves for extending the range and flexibility of a previously described method for the simultaneous measurement of resistivity and thickness of germanium epitaxial layers.
Keywords :
electric resistance measurement; electrical conductivity measurement; pulse modulation; semiconductors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19650163
