Title :
Production of p¿n junctions with bulk controlled characteristics
Author :
Maddex, K.A. ; Young, M.R.P.
Author_Institution :
Texas Instruments Ltd., Bedford, UK
fDate :
9/1/1965 12:00:00 AM
Abstract :
Two methods of eliminating surface effects so that microplasma breakdown of p¿n junctions can be observed are described, and their limitations are discussed. The first, applicable to diffused junctions, increases the space-charge-layer width, while the second reduces the applied voltage at the periphery of alloyed structures.
Keywords :
electric breakdown; plasma; semiconductor junctions;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19650176