Title :
Role of the Front Electron Collector in Rear Emitter Silicon Heterojunction Solar Cells
Author :
Varache, Renaud ; Aguila, Oriol Nos ; Valla, Anthony ; Nguyen, Nathalie ; Munoz, Delfina
Author_Institution :
Lab. for Heterojunction Solar Cells, Inst. Nat. de l´Energie Solaire, Le Bourget-du-Lac, France
Abstract :
Front electron collectors in rear emitter hydrogenated amorphous silicon/crystalline silicon (a- Si:H/c-Si) solar cells are comprehensively investigated with the objective of increasing cell power conversion efficiency. Since such cells benefit from the lateral electron conductivity of the n-doped substrate, the electrical constraint on the front transparent conductive oxide (TCO) layer is relaxed. However, cell improvement is only expected if the front side is optimized. Here, we present our understanding of recombination losses in the front amorphous silicon layers and at the a-Si:H/ c-Si interface, which determine the short-circuit current. In addition, we show how the TCO/(n + i)a-Si:H/(n)c-Si contact has to be finely engineered to minimize the resistance for electrons to be extracted. Both points are addressed through experimental and simulation works.
Keywords :
amorphous semiconductors; electrical conductivity; elemental semiconductors; hydrogen; semiconductor heterojunctions; short-circuit currents; silicon; solar cells; transparency; Si:H-Si; amorphous silicon layers; cell improvement; cell power conversion efficiency; electrical constraint; electron conductivity; electron resistance; front electron collector; front transparent conductive oxide layer; n-doped substrate; rear emitter hydrogenated amorphous silicon-crystalline silicon solar cells; rear emitter silicon heterojunction solar cells; short-circuit current; Absorption; Electrical resistance measurement; Indium tin oxide; Optical variables measurement; Passivation; Photovoltaic cells; Resistance; Amorphous silicon; heterojunction; photovoltaic cells; rear emitter; silicon; solar cells;
Journal_Title :
Photovoltaics, IEEE Journal of
DOI :
10.1109/JPHOTOV.2015.2400226