• DocumentCode
    867363
  • Title

    Performances of a Capacitorless 1T-DRAM Using Polycrystalline Silicon Thin-Film Transistors With Trenched Body

  • Author

    Lin, Jyi-Tsong ; Huang, Kuo-Dong ; Jheng, Bao-Tang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
  • Volume
    29
  • Issue
    11
  • fYear
    2008
  • Firstpage
    1222
  • Lastpage
    1225
  • Abstract
    Polycrystalline silicon thin-film transistors (TFTs) can be improved by integrating DRAM on chip. However, the TFT´s poor capacitance means that traditional DRAMs are infeasible, because they require a capacitor. An alternative, the one-transistor DRAM (1T-DRAM), is promising because it avoids the capacitor by instead storing the logical value as holes trapped in the body region. This letter proposes the use of a trenched body in a TFT to construct a 1T-DRAM. Previously, we have shown that a trenched body reduces the leakage current of a TFT. In this letter, we now show that the trenched-body TFT also works well as a 1T-DRAM device. It has a strong back-gating effect and a programming window that is more than twice as large as that of the conventional TFT.
  • Keywords
    DRAM chips; elemental semiconductors; leakage currents; semiconductor thin films; silicon; thin film transistors; 1T-DRAM chip; Si; TFT; back gating effect; leakage current; one-transistor DRAM; polycrystalline silicon thin film transistor; programming window; trenched body; Floating-body cell (FBC); one-transistor DRAM (1T-DRAM); polycrystalline silicon thin-film transistor (TFT); programming window;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.2004632
  • Filename
    4627438