DocumentCode :
867393
Title :
Shelf and operating life studies on SiO protected CdSe thin-film triodes
Author :
Gutierrez, W.A.
Volume :
53
Issue :
1
fYear :
1965
Firstpage :
92
Lastpage :
93
Keywords :
Aging; Circuit testing; Degradation; Electrodes; Fabrication; Life testing; Performance evaluation; Protection; Stability; Thin film transistors;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.3542
Filename :
1445472
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=867393
