DocumentCode :
867492
Title :
A worst-case analysis of tunnel-doide threshold-logic design
Author :
Chen, Y.B.
Volume :
53
Issue :
1
fYear :
1965
Firstpage :
103
Lastpage :
104
Keywords :
Artificial intelligence; Coupling circuits; Current supplies; Diodes; Inductance; Logic circuits; Logic devices; Performance analysis; Switching circuits; Weight control;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.3553
Filename :
1445483
Link To Document :
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