Title :
Single Bunch Profile Measurement Using Synchrotron Light from an Undulator
Author :
Bosser, J. ; Burnod, L. ; Coisson, R. ; Amico, E.D. ; Ferioli, G. ; Mann, J. ; Meot, F.
Author_Institution :
European Organization for Nuclear Research (CERN), 1211 Geneva 23, Switzerland
Keywords :
Frequency; Image edge detection; Interference; Magnetic fields; Magnets; Mirrors; Particle beams; Periodic structures; Synchrotron radiation; Undulators;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332748
