One-dimensional parallel Josephson-junction arrays as a tool for circuit diagnostics

Author

van der Zant, H.S.J. ; Orlando, T.P. ; Kleinsasser, A.W.

Author_Institution

MIT, Cambridge, MA, USA

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

3333

Lastpage

3336

Abstract

We propose and demonstrate the use of underdamped, one-dimensional parallel arrays of Josephson junctions as a tool for circuit diagnostics. By measuring the Fiske modes and the critical current in a magnetic field, we determined the self and nearest neighbor inductances as well as the capacitances of single junctions. We have used this technique to find the capacitance of Nb-Al/sub 2/O/sub x/-Nb junctions for critical current densities of 0.3-20 kA/cm/sup 2/. We find that the specific capacitance increases by about a factor of 2 over this range. This increase has important consequences for the design of single-flux-quantum circuits and SQUIDs. Measurement of the junction capacitance for critical current densities of 100 kA/cm/sup 2/ is possible, but requires submicron junctions with dimensions of the order of 0.3 /spl mu/m.<>

Keywords

Josephson effect; capacitance measurement; circuit testing; critical current density (superconductivity); inductance measurement; 0.3 micron; Fiske modes; Josephson junctions; Nb-Al/sub 2/O-Nb; Nb-Al/sub 2/O/sub x/-Nb junctions; SQUIDs; capacitance; circuit diagnostics; critical current densities; magnetic field; nearest neighbor inductance; self inductance; single-flux-quantum circuits; submicron junctions; underdamped one-dimensional parallel arrays; Capacitance measurement; Circuits; Critical current; Critical current density; Current measurement; Density measurement; Josephson junctions; Magnetic field measurement; Nearest neighbor searches; SQUIDs;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.403305

Filename

403305