DocumentCode
868417
Title
A New Approach for Fast Analysis of Spurious Emissions From RF/Microwave Circuits
Author
Hsieh, Han-Chang ; Chiu, Cheng-Nan ; Wang, Chi-Hsueh ; Chen, Chun Hsiung
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ. (NTU), Taipei, Taiwan
Volume
51
Issue
3
fYear
2009
Firstpage
631
Lastpage
638
Abstract
A new approach for fast analysis of the spurious emissions radiated from radio-frequency (RF)/microwave circuits with active and passive components is proposed. By incorporating the two-port-formulated analytical field expressions into the commercial circuit solver, one may quickly characterize the unwanted spurious emissions from RF/microwave circuits. Specifically, the developed model based on the field-expressions-incorporated circuit solver is efficient in handling the passive and active circuits with x- and y-directed wire structures on a printed circuit board. In this study, microstrip circuits such as the single trace, various right-angle bends, and the two-stage RF amplifier are dealt with, and the corresponding simulated results from the developed model are also validated by those from measurements and the commercial software EMSIM. For an electromagnetic interference engineer, the proposed new approach provides a simple model for quickly estimating the spurious emissions radiated from RF/microwave circuits, especially with active elements.
Keywords
electromagnetic interference; microstrip circuits; waveguide discontinuities; electromagnetic interference; microstrip circuits; microwave circuits; printed circuit board; radiofrequency circuits; right-angle bends; spurious emissions; Active circuits; Circuit simulation; Electromagnetic measurements; Microstrip; Microwave circuits; Printed circuits; Radio frequency; Radiofrequency amplifiers; Software measurement; Wire; Electromagnetic interference (EMI); microstrip amplifier; microstrip circuit; radiated emissions; right-angle bend;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2009.2020602
Filename
4926194
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