Title :
A New Approach for Fast Analysis of Spurious Emissions From RF/Microwave Circuits
Author :
Hsieh, Han-Chang ; Chiu, Cheng-Nan ; Wang, Chi-Hsueh ; Chen, Chun Hsiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ. (NTU), Taipei, Taiwan
Abstract :
A new approach for fast analysis of the spurious emissions radiated from radio-frequency (RF)/microwave circuits with active and passive components is proposed. By incorporating the two-port-formulated analytical field expressions into the commercial circuit solver, one may quickly characterize the unwanted spurious emissions from RF/microwave circuits. Specifically, the developed model based on the field-expressions-incorporated circuit solver is efficient in handling the passive and active circuits with x- and y-directed wire structures on a printed circuit board. In this study, microstrip circuits such as the single trace, various right-angle bends, and the two-stage RF amplifier are dealt with, and the corresponding simulated results from the developed model are also validated by those from measurements and the commercial software EMSIM. For an electromagnetic interference engineer, the proposed new approach provides a simple model for quickly estimating the spurious emissions radiated from RF/microwave circuits, especially with active elements.
Keywords :
electromagnetic interference; microstrip circuits; waveguide discontinuities; electromagnetic interference; microstrip circuits; microwave circuits; printed circuit board; radiofrequency circuits; right-angle bends; spurious emissions; Active circuits; Circuit simulation; Electromagnetic measurements; Microstrip; Microwave circuits; Printed circuits; Radio frequency; Radiofrequency amplifiers; Software measurement; Wire; Electromagnetic interference (EMI); microstrip amplifier; microstrip circuit; radiated emissions; right-angle bend;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2009.2020602