DocumentCode :
868469
Title :
Applications of FASTBUS to Beam Diagnostics and Experiment Data Systems
Author :
Machen, Donald R.
Author_Institution :
Scientific Systems International Los Alamos, New Mexico 87544 USA
Volume :
30
Issue :
4
fYear :
1983
Firstpage :
2328
Lastpage :
2330
Abstract :
A five-year effort by the North American NIM Committee, in collaboration with the ESONE Committee of European Laboratories, has resulted in a specification for the FASTBUS modular, high-speed data-acquisition system. The system is designed around an emitter-coupled logic (ECL) 32-bit data bus for asynchronous data transmission at 100 ns per transaction. Initial applications of FASTBUS will be in experiment data systems at accelerator facilities worldwide--beam diagnostic data systems on the accelerator side and particle-beam experiment data systems in the experimental area. As the specification (and the resulting hardware and software) matures, real-time machine-control applications will become possible. The FASTBUS specification has been proposed to the Institute of Electrical and Electronic Engineers (IEEE) for standardization in the United States (IEEE-P960), and the specification will be submitted to the international standards bodies for standardization on a worldwide scale in the near future. The details of the new standard are discussed by Costrell and Dawson at this conference. This paper will discuss the near-term use of FASTBUS in accelerator beam-diagnostics instrumentation systems, where an extra increment in system throughput and front-end processing speed can produce a greater understanding of the physical phenomena under study. The arguments and conclusions may be equally well applied to other similar data-handling problems requiring high bandwidth in the data system.
Keywords :
Application software; Collaboration; Data communication; Data systems; Fastbus; Hardware; Laboratories; Logic design; Particle accelerators; Standardization;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1983.4332805
Filename :
4332805
Link To Document :
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