Title :
Error-Resilient Motion Estimation Architecture
Author :
Varatkar, Girish Vishnu ; Shanbhag, Naresh R.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL
Abstract :
In this paper, we propose an energy-efficient motion estimation architecture. The proposed architecture employs the principle of error-resiliency to combat logic level timing errors that may arise in average-case designs in presence of process variations and/or due to overscaling of the supply voltage [voltage overscaling (VOS)] and thereby achieves power reduction. Error-resiliency is incorporated via algorithmic noise-tolerance (ANT). Referred to as input subsampled replica ANT (ISR-ANT), the proposed technique incorporates an input subsampled replica of the main sum-of-absolute-difference (MSAD) block for detecting and correcting errors in the MSAD block. Simulations show that the proposed technique can save up to 60% power over an optimal error-free system in a 130-nm CMOS technology. These power savings increase to 78% in a 45-nm predictive process technology. Performance of the ISR-ANT architecture in the presence of process variations indicates that average peak signal-to-noise ratio (PSNR) of the ISR-ANT architecture increases by up to 1.8 dB over that of the conventional architecture in 130-nm IBM process technology. Furthermore, the PSNR variation (sigma/mu) is also reduced by 7times over that of the conventional architecture at the slow corner while achieving a power reduction of 33%.
Keywords :
CMOS logic circuits; integrated circuit design; logic design; low-power electronics; motion estimation; multimedia computing; tolerance analysis; CMOS technology; error-resilient motion estimation architecture; error-tolerant design; errors correction; errors detection; logic level timing errors; main sum-of-absolute-difference block; peak signal-to-noise ratio; power reduction; predictive process technology; process variation-tolerance; size 130 nm; size 45 nm; subsampled replica algorithmic noise-tolerance; voltage overscaling; CMOS technology; Digital video broadcasting; Energy consumption; Energy efficiency; Logic design; Motion estimation; PSNR; Threshold voltage; Timing; Very large scale integration; Algorithmic noise-tolerance; error-tolerant design; low power design; motion estimation; process variation- tolerance;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2008.2000675