Title :
Reflectivity measurements of intracavity defects in laser diodes
Author :
Lambkin, Paul ; Percival, Christopher ; Corbett, Brian
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland
Abstract :
A method for measuring the complex reflectivity associated with a localized defect existing inside a laser diode cavity is presented. It relies on analyzing the magnitudes of resonant peaks in the Fourier transform of a subthreshold laser spectrum. Reflectivities between 0.01 and 0.02 with zero phase have been measured in a laser with a deliberately induced scattering center produced by standard lithographic techniques.
Keywords :
Fabry-Perot resonators; Fourier series; Fourier transform spectra; laser cavity resonators; quantum well lasers; reflectivity; Fabry-Perot resonator; Fourier transform spectrum; complex reflectivity; induced scattering center; intracavity defects; laser cavity; laser diodes; localized defect; quantum wells; resonant peaks; separate confinement heterostructure; subthreshold laser spectrum; subthreshold output intensity; Diode lasers; Etching; Fourier transforms; Helium; Measurement standards; Phase measurement; Reflectivity; Resonance; Scattering; Waveguide lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2003.820835
