DocumentCode

869095

Title

A simple derivation for the stability criterion of linear active two-ports

Author

Ku, W.H.

Volume

53

Issue

3

fYear

1965

fDate

3/1/1965 12:00:00 AM

Firstpage

310

Lastpage

311

Keywords

Capacitance measurement; Capacitors; Conductive films; Impedance; Insulation; Nitrogen; Silicon; Stability criteria; Substrates; Transistors;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.3707

Filename

1445637