• DocumentCode
    869205
  • Title

    Correct determination of lifetime for minority carriers in high-resistivity silicon--minimal thickness needed

  • Author

    Chaput, P. ; Blanc, D. ; Casanovas, E. ; Peyre-Lavigne, A. ; Chapuis, Anne-Marie ; Soudain, G.

  • Author_Institution
    Faculté des Sciences de l´´Université de Toulouse, Centre de Physique Nucléaire, Toulouse, France
  • Volume
    2
  • Issue
    6
  • fYear
    1966
  • fDate
    6/1/1966 12:00:00 AM
  • Firstpage
    223
  • Lastpage
    224
  • Abstract
    The minimal sample thickness needed to obtain a correct value of the lifetime of minority carriers is given. This thickness is 2.5 times the diffusion length for 500 Ωcm silicon and 1.5 times the diffusion length for 10000 Ωcm silicon.
  • Keywords
    semiconductors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19660189
  • Filename
    4206865
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=869205