Title :
Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges
Author :
Nguyen, T. ; O´Callaghan, J.M. ; Davidson, B.A. ; Redwing, R.D. ; Hohenwarter, G.K.G. ; Nordman, J.E. ; Beyer, J.B.
Author_Institution :
Wisconsin Univ., Madison, WI, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage .<>
Keywords :
1/f noise; barium compounds; flux flow; flux pinning; high-temperature superconductors; superconducting device noise; superconducting device testing; superconducting microbridges; superconducting thin films; yttrium compounds; 1/f noise; 10 Hz to 10 kHz; 50 G; DC voltage; Habbal-Joiner model; YBCO; YBaCuO; conduction; flux bundles; flux flow; flux lines; high-T/sub c/ thin-film microbridges; low-frequency noise; magnetic field; pinning; thinning; voltage noise power spectral density; Bridge circuits; Low-frequency noise; Magnetic field measurement; Magnetic films; Magnetic noise; Noise measurement; Superconducting device noise; Transistors; Voltage; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
