DocumentCode :
869252
Title :
A unified approach to the via minimization problem
Author :
Xiong, Xiao-Ming ; Kuh, Ernest S.
Author_Institution :
California Univ., Berkeley, CA, USA
Volume :
36
Issue :
2
fYear :
1989
fDate :
2/1/1989 12:00:00 AM
Firstpage :
190
Lastpage :
204
Abstract :
A unified via minimization approach for two-layer routing of printed circuit boards and VLSI chips is presented. A topological routing strategy for the unconstrained via minimization (UVM) problem is proposed. Both the constrained via minimization (CVM) and the UVM problems are treated under a unified {0,1} linear programming formulation. The proposed practical algorithm can handle both grid-based and grid-less routing. Also, an arbitrary number of wires is allowed to intersect at a via and both Manhattan and knock-knee routings are included in the treatment. Compared with existing algorithms, the proposed algorithm is a unified one and computationally efficient. The time and space complexities of the algorithm are O(nlog n+k) and O(n+k), respectively, where n is the number of layout objects and k is the total number of cross points, knock-knee points and via candidates
Keywords :
VLSI; circuit layout CAD; linear programming; printed circuit design; Manhattan; VLSI; computationally efficient; constrained; cross points; grid-based routing; grid-less routing; knock-knee routings; layout objects; printed circuit boards; space complexities; time complexities; topological routing strategy; two-layer routing; unconstrained; unified {0,1} linear programming; via candidates; via minimization problem; Integrated circuit interconnections; Joining processes; Linear programming; Manufacturing; Minimization; Printed circuits; Routing; Space technology; Topology; Very large scale integration; Wires;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/31.20197
Filename :
20197
Link To Document :
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