Title :
The critical current and normal resistance of high-T/sub c/ step-edge SNS junctions
Author :
Reintsema, C.D. ; Ono, R.H. ; Barnes, G. ; Borcherdt, L. ; Harvey, T.E. ; Kunkel, G. ; Rudman, D.A. ; Vale, L.R. ; Missert, N. ; Rosenthal, P.A.
Author_Institution :
Electromag. Technol. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
We have fabricated high-T/sub c/ superconductor-normal-superconductor Josephson junctions with a variety of controlled geometries and measured the resulting dependences of critical current and normal resistance. These studies show that we can adjust our junction parameters over orders of magnitude, thus allowing us to tailor the junctions for a variety of applications.<>
Keywords :
Josephson effect; critical currents; high-temperature superconductors; critical current; high-T/sub c/ superconductor; normal resistance; step-edge SNS junctions; superconductor-normal-superconductor Josephson junctions; Critical current; High temperature superconductors; Integrated circuit modeling; Josephson junctions; Microscopy; NIST; Proximity effect; Superconducting devices; Superconducting integrated circuits; Temperature dependence;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
