DocumentCode
869948
Title
The critical current and normal resistance of high-T/sub c/ step-edge SNS junctions
Author
Reintsema, C.D. ; Ono, R.H. ; Barnes, G. ; Borcherdt, L. ; Harvey, T.E. ; Kunkel, G. ; Rudman, D.A. ; Vale, L.R. ; Missert, N. ; Rosenthal, P.A.
Author_Institution
Electromag. Technol. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
5
Issue
2
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
3405
Lastpage
3409
Abstract
We have fabricated high-T/sub c/ superconductor-normal-superconductor Josephson junctions with a variety of controlled geometries and measured the resulting dependences of critical current and normal resistance. These studies show that we can adjust our junction parameters over orders of magnitude, thus allowing us to tailor the junctions for a variety of applications.<>
Keywords
Josephson effect; critical currents; high-temperature superconductors; critical current; high-T/sub c/ superconductor; normal resistance; step-edge SNS junctions; superconductor-normal-superconductor Josephson junctions; Critical current; High temperature superconductors; Integrated circuit modeling; Josephson junctions; Microscopy; NIST; Proximity effect; Superconducting devices; Superconducting integrated circuits; Temperature dependence;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.403323
Filename
403323
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