Title :
An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays
Author :
Berg, Melanie ; Wang, Jih-Jong ; Ladbury, Ray ; Buchner, Steve ; Kim, Hak ; Howard, Jim ; LaBel, Ken ; Phan, Anthony ; Irwin, Tim ; Friendlich, Mark
Author_Institution :
MEI Technol. Inc, NASA Goddard Space Flight Center, Greenbelt, MD
Abstract :
In order to investigate frequency and architectural effects on Single Event Upset cross sections within RTAX-S FPGA devices, a novel approach to high speed testing is implemented. Testing was performed at variable speeds ranging from 15 MHz to 150 MHz
Keywords :
design for testability; field programmable gate arrays; high-frequency effects; 15 to 150 MHz; Actel RTAX-S FPGA; architectural effects; field programmable gate arrays; high frequency effects; single event upset; Clocks; Field programmable gate arrays; Frequency; Logic devices; NASA; Pulse inverters; Shift registers; Single event upset; Space technology; Testing; Actel; FPGA; TMR; anti-fuse; high frequency; single event upsets; transients;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.886043
