Electron beam damaged high-T/sub c/ junctions-stability, reproducibility and scaling laws

Author

Pauza, A.J. ; Moore, D.F. ; Campbell, A.M. ; Broerst, A.N. ; Char, K.

Author_Institution

Interdisciplinary Res. Centre in Superconductivity, Cambridge Univ., UK

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

3410

Lastpage

3413

Abstract

The problems of stability and reproducibility of the electron beam irradiated high-T/sub c/ junctions have been studied. It is found that with a overdamage-anneal protocol that stable junctions can be obtained. While on chip uniformity can be very good (1%), the chip to chip reproducibility is not better than 20%. The annealing process allows us to vary T/sub c/ of the junctions over a wide range, making it possible to study the scaling behaviour of a single junction. We find that in these junctions I/sub c/R/sub n//spl prop/J/sub c//sup n/, with n=0.75-0.8 or, since the quasiparticle and Cooper-pair cross sections appear to be equivalent, I/sub c/R/sub n//spl prop//spl sigma//sub N//sup p/ where p=3.0-3.7.<>

Keywords

Josephson effect; annealing; electron beam effects; high-temperature superconductors; Cooper-pair cross sections; chip to chip reproducibility; chip uniformity; critical current normal resistance product; critical temperature; damage; electron beam irradiation; high-T/sub c/ junctions; overdamage-anneal; quasiparticle cross sections; scaling laws; stability; Annealing; Circuit stability; Conductive films; Electron beams; Gold; NIST; Production; Protocols; Reproducibility of results; Superconductivity;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.403324

Filename

403324