DocumentCode
870054
Title
Single-Event Transients in Bipolar Linear Integrated Circuits
Author
Buchner, Stephen ; McMorrow, Dale
Author_Institution
QSS Group Inc, Lanham, MD
Volume
53
Issue
6
fYear
2006
Firstpage
3079
Lastpage
3102
Abstract
Single-event transients (SETs) in linear integrated circuits have caused anomalies in a number of spacecraft. The consequences of these anomalies have spurred efforts to better understand SETs, including the mechanisms responsible for their generation, the best approaches for testing, how data should be analyzed and presented, and approaches for mitigation
Keywords
bipolar analogue integrated circuits; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; SET; bipolar linear integrated circuits; data analysis; hardening; single-event transients; spacecraft; testing approaches; Analog circuits; Analog integrated circuits; CMOS technology; Linear circuits; Operational amplifiers; P-n junctions; Pulse amplifiers; Space vehicles; Voltage; Voltage-controlled oscillators; Heavy ions; linear circuits; pulsed laser; single-event transients (SETs);
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2006.882497
Filename
4033272
Link To Document