DocumentCode :
870089
Title :
A probabilistic active support vector learning algorithm
Author :
Mitra, Pabitra ; Murthy, C.A. ; Pal, Sankar K.
Author_Institution :
Machine Intelligence Unit, Indian Stat. Inst., Calcutta, India
Volume :
26
Issue :
3
fYear :
2004
fDate :
3/1/2004 12:00:00 AM
Firstpage :
413
Lastpage :
418
Abstract :
The paper describes a probabilistic active learning strategy for support vector machine (SVM) design in large data applications. The learning strategy is motivated by the statistical query model. While most existing methods of active SVM learning query for points based on their proximity to the current separating hyperplane, the proposed method queries for a set of points according to a distribution as determined by the current separating hyperplane and a newly defined concept of an adaptive confidence factor. This enables the algorithm to have more robust and efficient learning capabilities. The confidence factor is estimated from local information using the k nearest neighbor principle. The effectiveness of the method is demonstrated on real-life data sets both in terms of generalization performance, query complexity, and training time.
Keywords :
data mining; learning (artificial intelligence); pattern recognition; probability; support vector machines; SVM; adaptive confidence factor; data mining; generalization performance; k nearest neighbor principle; pattern recognition; probabilistic active learning; query complexity; real life data sets; statistical query model; support vector learning algorithm; support vector machine; training time; Algorithm design and analysis; Design optimization; Iterative algorithms; Lagrangian functions; Large-scale systems; Machine learning; Quadratic programming; Robustness; Support vector machine classification; Support vector machines; Algorithms; Artificial Intelligence; Breast Neoplasms; Cluster Analysis; Computing Methodologies; Diagnosis, Computer-Assisted; Humans; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2004.1262340
Filename :
1262340
Link To Document :
بازگشت