• DocumentCode
    870173
  • Title

    Feature space trajectory methods for active computer vision

  • Author

    Sipe, Michael A. ; Casasent, David

  • Author_Institution
    Cellomics Inc., Pittsburgh, PA, USA
  • Volume
    24
  • Issue
    12
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    1634
  • Lastpage
    1643
  • Abstract
    We advance new active object recognition algorithms that classify rigid objects and estimate their pose from intensity images. Our algorithms automatically detect if the class or pose of an object is ambiguous in a given image, reposition the sensor as needed, and incorporate data from multiple object views in determining the final object class and pose estimate. A probabilistic feature space trajectory (FST) in a global eigenspace is used to represent 3D distorted views of an object and to estimate the class and pose of an input object. Confidence measures for the class and pose estimates, derived using the probabilistic FST object representation, determine when additional observations are required as well as where the sensor should be positioned to provide the most useful information. We demonstrate the ability to use FSTs constructed from images rendered from computer-aided design models to recognize real objects in real images and present test results for a set of metal machined parts.
  • Keywords
    CAD; active vision; image classification; object recognition; probability; 3D distorted views; active computer vision; active object recognition algorithms; computer-aided design models; feature space trajectory methods; global eigenspace; metal machined parts; multiple object views; pose estimation; rigid object classification; sensor; Computer vision; Design automation; Distortion measurement; Image recognition; Image sensors; Object detection; Object recognition; Position measurement; Rendering (computer graphics); Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2002.1114854
  • Filename
    1114854