DocumentCode :
870274
Title :
A critical examination of the assumptions underlying macroscopic transport equations for silicon devices
Author :
Stettler, Mark A. ; Alam, Muhammad A. ; Lundstrom, Mark S.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
40
Issue :
4
fYear :
1993
fDate :
4/1/1993 12:00:00 AM
Firstpage :
733
Lastpage :
740
Abstract :
Assumptions used to derive macroscopic transport equations for silicon devices are critically examined. The position- and momentum-dependent distribution function for a silicon n-i-n diode is obtained from a rigorous solution to the Boltzmann equation, and various macroscopic quantities, such as the electron temperature tensor, energy and heat fluxes, and mobility, are rigorously evaluated and compared with widely used approximations. The common approximation of the heat flux by Fourier´s law is shown to differ substantially from the actual heat flux. The results also show that at a given energy, the mobility within a submicrometer device can be much different than that for electrons at the same energy in bulk silicon
Keywords :
semiconductor device models; semiconductor diodes; Boltzmann equation; Fourier´s law; Si devices; assumptions; critical examination; electron temperature tensor; energy flux; heat flux; macroscopic quantities; macroscopic transport equations; mobility; modelling; momentum-dependent distribution function; n-i-n diode; position-dependent distribution function; rigorous solution; submicrometer device; Acoustic scattering; Boltzmann equation; Diodes; Distribution functions; Electron mobility; Jacobian matrices; Phonons; Silicon devices; Temperature; Thermal conductivity;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.202785
Filename :
202785
Link To Document :
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