• DocumentCode
    870442
  • Title

    Absence of quantum 1/f noise in the photoelectric current of junction of MIS photodetectors

  • Author

    Handel, Peter H.

  • Author_Institution
    Dept. of Phys., Missouri Univ., St. Louis, MO
  • Volume
    40
  • Issue
    4
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    833
  • Abstract
    Quantum 1/f noise is given by a simple engineering formula. It affects photodetectors through mobility and recombination speed fluctuations. The former are also in the diffusion constant, and all affect the dark current. However, there is no quantum 1/f noise in the photogeneration of carriers, as is shown
  • Keywords
    metal-insulator-semiconductor devices; photodetectors; semiconductor device models; semiconductor device noise; MIS photodetectors; junction photodetectors; photoelectric current; photogeneration of carriers; quantum 1/f noise absence; Dark current; Fluctuations; Frequency; Fusion power generation; Particle scattering; Photodetectors; Physics; Radiative recombination; Schottky diodes; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.202800
  • Filename
    202800