DocumentCode :
870567
Title :
Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors
Author :
Sohn, So Young ; Moon, Hyoung Uk
Author_Institution :
Dept. of Comput. Sci. & Ind. Syst. Eng., Yonsei Univ., Seoul, South Korea
Volume :
26
Issue :
4
fYear :
2003
Firstpage :
338
Lastpage :
344
Abstract :
In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.
Keywords :
error analysis; genetic algorithms; inspection; optimal control; tolerance analysis; cost of ownership; genetic algorithm; inspection cost; inspection equipment; manufacturing environment; multiattribute inspection errors; optimal tolerance levels; Cost function; Flat panel displays; Frequency; Genetic algorithms; Inspection; Manuals; Manufacturing; Moon; Semiconductor device modeling; Standards development;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2003.822081
Filename :
1262388
Link To Document :
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