DocumentCode :
870679
Title :
New quality cost models to optimize inspection strategies [Abstracts of Forthcoming Manuscripts]
Author :
Oppermann, Martin ; Sauer, Wilfried ; Wohlrabe, Heinz ; Zerna, Thomas
Author_Institution :
Dresden University of Technology
Volume :
26
Issue :
4
fYear :
2003
Firstpage :
266
Lastpage :
266
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2003.823160
Filename :
1262401
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=870679
