New quality cost models to optimize inspection strategies [Abstracts of Forthcoming Manuscripts]

Author

Oppermann, Martin ; Sauer, Wilfried ; Wohlrabe, Heinz ; Zerna, Thomas

Author_Institution

Dresden University of Technology

Volume

Issue

fYear

2003

Firstpage

266

Lastpage

266

fLanguage

English

Journal_Title

Electronics Packaging Manufacturing, IEEE Transactions on

Publisher

ieee

ISSN

1521-334X

Type

DOI

10.1109/TEPM.2003.823160

Filename

1262401

Link To Document