Title :
Elastic and piezoelectric properties of La/sub 3/Ga/sub 5/SiO/sub 14/ and La/sub 3/Ga/sub 5.5/Ta/sub 0.5/O/sub 14/: an application of resonant ultrasound spectroscopy
Author :
Schreuer, Jürgen
Author_Institution :
Lab. of Crystallogr., Swiss Fed. Inst. of Technol., Zurich, Switzerland
Abstract :
The electromechanical properties of La/sub 3/Ga/sub 5/SiO/sub 14/ (LGS) and La/sub 3/Ga/sub 5.5/Ta/sub 0.5/O/sub 14/ (LGT) have been studied at room temperature on 25 samples using resonant ultrasound spectroscopy (RUS). The RUS method facilitates simultaneous determination of all independent elastic and piezoelectric constants of a sample within the same frequency range and yields sample parameters with high internal consistency. Consequently, the spread of the experimental results presented here is significantly lower than the scatter of literature data obtained by different experimental techniques.
Keywords :
acoustic resonance; elastic constants; gallium compounds; lanthanum compounds; piezoelectric materials; ultrasonic measurement; La/sub 3/Ga/sub 5.5/Ta/sub 0.5/O/sub 14/; La/sub 3/Ga/sub 5/SiO/sub 14/; elastic compliances; elastic constants; electromechanical properties; high internal consistency; inverse problem; least squares refinements; piezoelectric constants; piezoelectric stress tensor; resonant ultrasound spectroscopy; room temperature; simultaneous determination; Acoustic scattering; Crystallization; Crystallography; Dielectric constant; Dielectric measurements; Frequency; Resonance; Shape measurement; Spectroscopy; Ultrasonic imaging; Crystallography; Elasticity; Electrochemistry; Magnetic Resonance Spectroscopy; Models, Chemical; Oxides; Sensitivity and Specificity; Silicates; Stress, Mechanical; Transducers; Ultrasonography; Vibration;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2002.1049728
