Title :
LiNbO3-based integrated optical network analyser for vectorial structure characterisation of fibre Bragg gratings
Author :
Bhandare, S. ; Sandel, D. ; Noé, R. ; Ricken, R. ; Suche, H. ; Sohler, W.
Author_Institution :
Univ. of Paderborn, Germany
Abstract :
A LiNbO3-based integrated optical network analyser for polarisation-resolved longitudinal structure characterisation of optical fibre Bragg gratings is reported. The frequency-dependent complete reflectance Jones matrix is measured by interferometry and transformed into the time-domain impulse response. From the impulse response matrix the vectorial grating structure is determined by inverse scattering. Local dichroic reflectivity and birefringence were derived from this data. Knowledge of the vectorial nature of refractive index modulation depth and phase should allow an improvement of the ultraviolet (UV) illumination process and an effective correction of phase mask errors by longitudinally selective UV light post-processing, in order to fabricate chirped and/or apodised gratings which require the highest fabrication accuracy.
Keywords :
Bragg gratings; birefringence; integrated optics; light scattering; lithium compounds; matrix algebra; network analysers; optical communication equipment; optical fibre networks; optical fibre testing; reflectivity; refractive index; telecommunication equipment testing; ultraviolet radiation effects; LiNbO3; LiNbO3-based integrated optical network analyser; apodised gratings; birefringence; chirped gratings; effective phase mask error correction; fabrication accuracy; frequency-dependent complete reflectance Jones matrix; interferometry; inverse scattering; local dichroic reflectivity; longitudinally selective UV light post-processing; optical fibre Bragg gratings; polarisation-resolved longitudinal structure characterisation; refractive index modulation depth; refractive index modulation phase; time-domain impulse response matrix; ultraviolet illumination process; vectorial grating structure;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
DOI :
10.1049/ip-cds:20030762